Call for Paper:QRS 2017
In 2015, the SERE conference (IEEE International Conference on Software Security and Reliability) and the QSIC conference (IEEE International Conference on Quality Software) were combined into a single conference, QRS, with Q representing Quality, R for Reliability, and S for Security, sponsored by the IEEE Reliability Society. This conference provides engineers and scientists from both industry and academia a platform to present their ongoing work, relate their research outcomes and experiences, and discuss the best and most efficient techniques for the development of reliable, secure, and trustworthy systems. It also represents an excellent opportunity for the academic community to become more aware of subject areas critical to the software industry as practitioners bring their needs to the table. The 2017 QRS conference will be held from July 26th to 28th in Prague, Czech.
TOPICS OF INTEREST
 Reliability, security, availability, and safety of software systems
 Software testing, verification and validation
 Program debugging and comprehension
 Information and software assurance
 Fault tolerance for software reliability improvement
 Modeling, prediction, simulation, and evaluation
 Metrics, measurements, and analysis
 Secure and reliable storage
 Software penetration and protection  Software vulnerabilities
 Formal methods
 Malware detection and analysis
 Intrusion detection and prevention
 Operating system security and reliability
 Mobile and smartphone applications
 Internet of things and cloud computing
 Information and knowledge management
 Benchmark, tools, and empirical studies
IMPORTANT DATES
 January 15, 2017: Workshop proposals due
 March 1, 2017: Abstracts due
 March 8, 2017: Regular & Short papers due
 April 1, 2017: Workshop & Student Doctoral Program due  April 1, 2017: Fast Abstract Track due
 May 25, 2017: Author notification
 June 5, 2017: Camera-ready & author registration due
 July 26-28, 2017: Conference dates
SUBMISSION
Submit original manuscripts (not published or considered elsewhere) with the following page maximums: twelve pages (regular papers), eight pages (short papers, workshop papers, and Student Doctoral Program), and two pages (Fast Abstract Track). Each paper should include a title and the name and affiliation of each author. Except for the Fast Abstract Track, each submission should also include a 150-word abstract and up to 6 keywords. The format of your submission must follow the guidelines for IEEE conference proceedings. The first author of a Student Doctoral Program submission must be a student. At least one Best Paper Award with a cash prize will be presented. Detailed instructions for paper submission can be found at http://paris.utdallas.edu/qrs17.
ONFERENCE PROCEEDINGS & SPECIAL SECTION OF IEEE TRANSACTIONS ON RELIABILITY
IEEE Computer Society Conference Publishing Services (CPS) will publish the proceedings. Accepted papers will also be submitted for inclusion in the IEEE Xplore and to other abstracting and indexing partners such as the Ei Compendex. Authors of selected best papers from the conference will be invited to submit an extended version to a special section of IEEE Transactions on Reliability.
ORGANIZING COMMITTEE
 General Chair Mladen Vouk North Carolina State University, USA
 General Chair Irena Bojanova National Institute of Standards and Technology, USA
 Program Chair Manuel Nuñez Universidad Complutense de Madrid, Spain
 Program Chair Tadashi Dohi Hiroshima University, Japan
 Program Chair Xiaoying Bai Tsinghua University, China
 China Liaison Yuanshun Dai University of Electronic Science and Technology of China, China
 South America Liaison Jose Maldonado University of Sao Paulo, Brazil
STEERING COMMITTEE CHAIRS
 W. Eric Wong University of Texas at Dallas, USA
 T.H. Tse The University of Hong Kong, Hong Kong
GENERAL INQUIRIES
For more detailed and updated information, please refer to http://paris.utdallas.edu/qrs17, or contact Steering Committee Chair, Professor W. Eric Wong, at ewong2006@gmail.com, or General Chairs: Professor Mladen Vouk at vouk@ncsu.edu or Dr. Irena Bojanova at irena. v.bojanova@gmail.com.
 
          







